000 00521nam a2200121Ia 4500
008 220615s9999||||xx |||||||||||||| ||und||
100 _aIgor Djerdj (Ed.)
245 0 _aRietveld Refinement in the Characterization of Crystalline Materials
546 _aEnglish[eng]
650 _aRietveld method||Structural characterization||Microstructural analysis||Crystalline materials||Structural materials||X-ray and neutron diffraction||Functional materials
856 _uhttps://www.mdpi.com/books/pdfview/book/1111
942 _cEB
999 _c13686
_d13686