Crouch, Alfred L <br/><br/>
Design for test: For digital IC'S and embedded core systems 

 - New Delhi  Pearson Education  1999 
 - 348 
<br/><br/><label>ISBN: </label>9788131717899 
<br/><br/><label>Subjects--Topical Terms: </label><br/>EMBEDDED SYSTEMS<br/>INTEGRATED CIRCUITS
<br/><br/><label>Dewey Class. No.: </label>005.18 CRO/D