TY  - BOOK
AU  - Igor Djerdj (Ed.)
TI  - Rietveld Refinement in the Characterization of Crystalline Materials
KW  - Rietveld method||Structural characterization||Microstructural analysis||Crystalline materials||Structural materials||X-ray and neutron diffraction||Functional materials
UR  - https://www.mdpi.com/books/pdfview/book/1111
ER  -