Kühnert, Christian <br/><br/>
Data-driven Methods for Fault Localization in Process Technology 

<br/><br/><br/>English[eng] 
<br/><br/><label>ISSN: </label>18636489 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Time series||Signal processing||Data Mining||System identification||Causality