Miniaturized Transistors (Record no. 7648)

MARC details
000 -LEADER
fixed length control field 01966nam a2200121Ia 4500
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 220615s9999||||xx |||||||||||||| ||und||
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Grasser, Tibor||Filipovic, Lado
245 #0 - TITLE STATEMENT
Title Miniaturized Transistors
546 ## - LANGUAGE NOTE
Language note English[eng]
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element MOSFET||n/a||total ionizing dose (TID)||low power consumption||process simulation||two-dimensional material||negative-capacitance||power consumption||technology computer aided design (TCAD)||thin-film transistors (TFTs)||band-to-band tunneling (BTBT)||nanowires||inversion channel||metal oxide semiconductor field effect transistor (MOSFET)||spike-timing-dependent plasticity (STDP)||field effect transistor||segregation||systematic variations||Sentaurus TCAD||indium selenide||nanosheets||technology computer-aided design (TCAD)||high-? dielectric||subthreshold bias range||statistical variations||fin field effect transistor (FinFET)||compact models||non-equilibrium Green’s function||etching simulation||highly miniaturized transistor structure||compact model||silicon nanowire||surface potential||Silicon-Germanium source/drain (SiGe S/D)||nanowire||plasma-aided molecular beam epitaxy (MBE)||phonon scattering||mobility||silicon-on-insulator||drain engineered||device simulation||variability||semi-floating gate||synaptic transistor||neuromorphic system||theoretical model||CMOS||ferroelectrics||tunnel field-effect transistor (TFET)||SiGe||metal gate granularity||buried channel||ON-state||bulk NMOS devices||ambipolar||piezoelectrics||tunnel field effect transistor (TFET)||FinFETs||polarization||field-effect transistor||line edge roughness||random discrete dopants||radiation hardened by design (RHBD)||low energy||flux calculation||doping incorporation||low voltage||topography simulation||MOS devices||low-frequency noise||high-k||layout||level set||process variations||subthreshold||metal gate stack||electrostatic discharge (ESD)
856 ## - ELECTRONIC LOCATION AND ACCESS
Uniform Resource Identifier <a href="https://mdpi.com/books/pdfview/book/1370">https://mdpi.com/books/pdfview/book/1370</a>
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type E-Books
Holdings
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        Kerala University of Digital Sciences, Innovation and Technology Knowledge Centre Kerala University of Digital Sciences, Innovation and Technology Knowledge Centre 15/06/2022   15/06/2022 15/06/2022 E-Books